000 01866cam a22004454a 4500
001 14123478
003 OSt
005 20231006133430.0
008 050928s2006 njua b 001 0 eng
010 _a 2005028448
015 _aGBA627486
_2bnb
016 7 _a013414729
_2Uk
020 _a0471784060 (cloth : alk. paper)
_cRM597.09
020 _a9780471784067
_cRM597.09
035 _a(OCoLC)ocm61821738
040 _aDLC
_cKKKUANTANNTANNTAN
_dKKKUANTANNTAN
_dBAKER
_dC#P
_dCOO
_dDLC
_bEnglish
042 _apcc
050 0 0 _aTK7871.85
_b.M379 2006
082 0 0 _a621.3815/2
_222
100 1 _aMay, Gary S.
245 1 0 _aFundamentals of semiconductor manufacturing and process control /
_cGary S. May, Costas J. Spanos.
260 _a[Piscataway] :
_bIEEE ;
_aHoboken, N.J. :
_bWiley-Interscience,
_cc2006.
264 _aHoboken, N.J. :
_bWiley-Interscience,
_c©2006
300 _axix, 463 pages:
_billustrations;
_c25 cm.
336 _atext
_brdacontent
337 _aunmediated
_brdamedia
338 _avolume
_brdacarrier
504 _aIncludes bibliographical references and index.
650 0 _aSemiconductors
_xDesign and construction.
650 0 _aIntegrated circuits
_xDesign and construction.
650 0 _aProcess control
_xStatistical methods.
658 _cSTE
700 1 _aSpanos, Costas J.
856 4 1 _3Table of contents
_uhttp://www.loc.gov/catdir/toc/ecip061/2005028448.html
856 4 2 _3Publisher description
_uhttp://www.loc.gov/catdir/enhancements/fy0660/2005028448-d.html
856 4 2 _3Contributor biographical information
_uhttp://www.loc.gov/catdir/enhancements/fy0740/2005028448-b.html
906 _a7
_bcbc
_corignew
_d1
_eecip
_f20
_gy-gencatlg
942 _2lcc
_n0
_cBK
999 _c4288
_d4288